Hitachi S-3500N SEM
Variable pressure, 0.1-30 kV, Hitachi S-3500N scanning electron microscope capable of detecting secondary and backscattered electron signals.
An energy dispersive X-ray spectroscopy (EDS) detector with 10 mm2 Si (Li) provides elemental identification, mapping and quantitative compositional information of a sample. Elements from atomic number 5 through 92 can be detected.
SEM is used in characterization of biological structures, particulates, defects, grain structure, aggregation effects, coating thickness on material structures, oxide films, glasses, ceramics, and polymers.